Inline Conductivity Probe
InPro 7100i Digital Conductivity Sensor for Buffer and Media Prep
The METTLER TOLEDO InPro 7100 digital inline conductivity probe is particularly suited for use with single use mixing and buffer storage bags. The fast response time allows quick detection of process changes, leading to better process control. The PEEK shaft material offers high resistivity against aggressive solutions and is particularly suitable in process with frequent CIP / SIP cycles. The InPro 7100 can be used for sterile insertion into bioprocess containers.
Mettler-Toledo Intelligent Sensor Management
With Mettler-Toledo’s advanced Intelligent Sensor Management (ISM), these concerns are a thing of the past! ISM has been around for years helping all kinds of processes have accurate and assured calibrations and maintenance statuses throughout the whole line of Mettler-Toledo sensors. This technology sends you automatic diagnostic data about your sensor’s:
• Health • Dynamic lifetime • Calibration quality
• Glass strength • Sensor drift
Utilizing this technology would allow you to go into a run or experiment 100% certain that your probes will not be an issue and can move forward with peace of mind. By choosing one of the many Mettler-Toledo sensors equipped with ISM technology, you’ll save on manual labor, experimental waste/time, and be sure you won’t have experimental error due to sensor drift or misreading. With all of this, it makes it an easy choice to move towards ISM probes for your R&D lab or large-scale facility.
Which brings us to a really BIG announcement…
Mettler-Toledo recently launched ISM 2.0 which comes equipped with the same features described but with greater control, reliability, and software to bolster the ease of use and peace of mind that comes with these sensors. ISM 2.0 adds upgrades to the lifetime and calibration algorithms that make them even more accurate at telling you the health and quality of your data and sensors. The upgrade comes partnered with more robust software for enhanced process reliability.